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	Influence analysis of microscopic image quality in surface topography measurement with Focus Variation
	Tian, Yingzhong[1]; Zhang, Wenjun[2]; Qi, Ji[3]; Jia, Tinggang[4]; Li, Long[5]
	2016
会议名称	4th International Conference on Machinery, Materials and Computing Technology (ICMMCT)
关键词	Measure strategies Microscopic image quality Surface metrology 3D model construction
页码	1788-1794
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/2226967
专题	上海大学
作者单位	1.[1]Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai Key Lab Intelligent Mfg & Robot, Shanghai 200072, Peoples R China. 2.[2]Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai Key Lab Intelligent Mfg & Robot, Shanghai 200072, Peoples R China. 3.[3]Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai Key Lab Intelligent Mfg & Robot, Shanghai 200072, Peoples R China. 4.[4]Shanghai Elect Grp Co Ltd, Shanghai 200072, Peoples R China. 5.[5]Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai Key Lab Intelligent Mfg & Robot, Shanghai 200072, Peoples R China.
推荐引用方式 GB/T 7714	Tian, Yingzhong[1],Zhang, Wenjun[2],Qi, Ji[3],et al. Influence analysis of microscopic image quality in surface topography measurement with Focus Variation[C]. 见:4th International Conference on Machinery, Materials and Computing Technology (ICMMCT).

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