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Controlled wrinkling analysis of thin films on gradient substrates
Zhao, Jianzhong[1]; Guo, Xingming[2]; Lu, Lu[3]
刊名APPLIED MATHEMATICS AND MECHANICS-ENGLISH EDITION
2017
卷号38页码:617-624
关键词thin film gradient substrate wrinkle material gradient Galerkin method
ISSN号0253-4827
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/2190641
专题上海大学
作者单位1.[1]Shanghai Univ, Shanghai Inst Appl Math & Mech, Shanghai Key Lab Mech Energy Engn, Shanghai 200072, Peoples R China.
2.[2]Shanghai Univ, Shanghai Inst Appl Math & Mech, Shanghai Key Lab Mech Energy Engn, Shanghai 200072, Peoples R China.
3.[3]Shanghai Univ, Shanghai Inst Appl Math & Mech, Shanghai Key Lab Mech Energy Engn, Shanghai 200072, Peoples R China.
推荐引用方式
GB/T 7714
Zhao, Jianzhong[1],Guo, Xingming[2],Lu, Lu[3]. Controlled wrinkling analysis of thin films on gradient substrates[J]. APPLIED MATHEMATICS AND MECHANICS-ENGLISH EDITION,2017,38:617-624.
APA Zhao, Jianzhong[1],Guo, Xingming[2],&Lu, Lu[3].(2017).Controlled wrinkling analysis of thin films on gradient substrates.APPLIED MATHEMATICS AND MECHANICS-ENGLISH EDITION,38,617-624.
MLA Zhao, Jianzhong[1],et al."Controlled wrinkling analysis of thin films on gradient substrates".APPLIED MATHEMATICS AND MECHANICS-ENGLISH EDITION 38(2017):617-624.
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