| A Wiener process model with truncated normal distribution for reliability analysis (EI收录) | |
| Pan, Donghui[1]; Liu, Jia-Bao[2]; Huang, Fanglun[1]; Cao, Jinde[3,4]; Alsaedi, Ahmed[5] | |
| 刊名 | Applied Mathematical Modelling
 |
| 2017 | |
| 卷号 | 50页码:333-346 |
| 关键词 | Deterioration Image segmentation Maximum principle Normal distribution Probability density function Probability distributions Random processes Reliability Wheels |
| URL标识 | 查看原文 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/2185948 |
| 专题 | 华南理工大学 |
| 作者单位 | 1.[1] School of Mathematical Sciences, Anhui University, Hefei 2.230601, China 3.[2] School of Mathematics and Physics, Anhui Jianzhu University, Hefei 4.230601, China 5.[3] Research Center for Complex Systems and Network Science, School of Mathematics, Southeast University, Nanjing 6.210096, China 7.[4] School of Mathematical Sciences, Shandong Normal University, Ji'nan 8.Shandong 9.250014, China 10.[5] Nonlinear Analysis and Applied Mathematics Research Group, Department of Mathematics, Faculty of Science, King Abdulaziz University, PO Box 80257, Jeddah |
| 推荐引用方式 GB/T 7714 | Pan, Donghui[1],Liu, Jia-Bao[2],Huang, Fanglun[1],等. A Wiener process model with truncated normal distribution for reliability analysis (EI收录)[J]. Applied Mathematical Modelling,2017,50:333-346. |
| APA | Pan, Donghui[1],Liu, Jia-Bao[2],Huang, Fanglun[1],Cao, Jinde[3,4],&Alsaedi, Ahmed[5].(2017).A Wiener process model with truncated normal distribution for reliability analysis (EI收录).Applied Mathematical Modelling,50,333-346. |
| MLA | Pan, Donghui[1],et al."A Wiener process model with truncated normal distribution for reliability analysis (EI收录)".Applied Mathematical Modelling 50(2017):333-346. |
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