Line-planes deflectometry | |
Li, Chen[1]; Zhang, Xu[2]; Tu, Dawei[3] | |
刊名 | MEASUREMENT SCIENCE AND TECHNOLOGY
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2018 | |
卷号 | 29 |
关键词 | line-planes deflectometry incident light plane incident light point light source radial basis function interpolation |
ISSN号 | 0957-0233 |
URL标识 | 查看原文 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2170875 |
专题 | 上海大学 |
作者单位 | 1.[1]Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai 200072, Peoples R China. 2.[2]Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai 200072, Peoples R China. 3.[3]Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai 200072, Peoples R China. |
推荐引用方式 GB/T 7714 | Li, Chen[1],Zhang, Xu[2],Tu, Dawei[3]. Line-planes deflectometry[J]. MEASUREMENT SCIENCE AND TECHNOLOGY,2018,29. |
APA | Li, Chen[1],Zhang, Xu[2],&Tu, Dawei[3].(2018).Line-planes deflectometry.MEASUREMENT SCIENCE AND TECHNOLOGY,29. |
MLA | Li, Chen[1],et al."Line-planes deflectometry".MEASUREMENT SCIENCE AND TECHNOLOGY 29(2018). |
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