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	Enhancing primary processing for small-angle X-ray scattering
	Wei,Yanru; Li,Zhihong
刊名	Instrumentation Science & Technology
	2017
卷号	Vol.45 No.1页码:22-34
关键词	Detector tilt primary data processing program small-angle X-ray scattering
ISSN号	1073-9149;1525-6030
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2158369
专题	安徽大学
作者单位	1.Anhui Univ, Inst Hlth Sci, Hefei, Peoples R China 2.Chinese Acad Sci, Inst High Energy Phys, Beijing Synchrotron Radiat Facil, POB 918, Beijing 100049, Peoples R China
推荐引用方式 GB/T 7714	Wei,Yanru,Li,Zhihong. Enhancing primary processing for small-angle X-ray scattering[J]. Instrumentation Science & Technology,2017,Vol.45 No.1:22-34.
APA	Wei,Yanru,&Li,Zhihong.(2017).Enhancing primary processing for small-angle X-ray scattering.Instrumentation Science & Technology,Vol.45 No.1,22-34.
MLA	Wei,Yanru,et al."Enhancing primary processing for small-angle X-ray scattering".Instrumentation Science & Technology Vol.45 No.1(2017):22-34.

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