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	Dielectric relaxations in pure, La-doped, and (La, Co)-codoped BiFeO3: Post-sintering annealing studies
	Y.M. Guo; Y.D. Li; Q.Q. Wang; Y. Yu; H. Wang; N. Zhang; S.G. Huang; Q.J. Li; C.C. Wang; Z.Q. Lin
刊名	Journal of Alloys and Compounds
	2018
卷号	Vol.745页码:401-408
关键词	Ceramics Multiferroics Dielectric relaxations Oxygen boundaries Annealing
ISSN号	0925-8388
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2156071
专题	安徽大学
作者单位	1.Center of Modern Experimental Technology, Anhui University, Hefei 230039, PR China 2.a Laboratory of Electronic and Ionic Functional Materials, School of Physics & Material Science, Anhui University, Hefei 230601, PR China
推荐引用方式 GB/T 7714	Y.M. Guo,Y.D. Li,Q.Q. Wang,et al. Dielectric relaxations in pure, La-doped, and (La, Co)-codoped BiFeO3: Post-sintering annealing studies[J]. Journal of Alloys and Compounds,2018,Vol.745:401-408.
APA	Y.M. Guo.,Y.D. Li.,Q.Q. Wang.,Y. Yu.,H. Wang.,...&Z.Q. Lin.(2018).Dielectric relaxations in pure, La-doped, and (La, Co)-codoped BiFeO3: Post-sintering annealing studies.Journal of Alloys and Compounds,Vol.745,401-408.
MLA	Y.M. Guo,et al."Dielectric relaxations in pure, La-doped, and (La, Co)-codoped BiFeO3: Post-sintering annealing studies".Journal of Alloys and Compounds Vol.745(2018):401-408.

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