Equivalency and Locality in Nano-Scale Measurement

CORC > 力学研究所 > 中国科学院力学研究所 > 力学所知识产出(1956-2008)

	Equivalency and Locality in Nano-Scale Measurement
	Hu M(胡明); Wang HY(汪海英); Bai YL(白以龙); Xia MF(夏蒙棼); Ke FJ(柯孚久)
刊名	International Journal of Nonlinear Sciences and Numerical Simulation
	2005
通讯作者邮箱	huming@lnm.imech.ac.cn
卷号	6 期号:3 页码:235-242
ISSN号	1565-1339
通讯作者	Hu, M (reprint author), Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech, Beijing 100080, Peoples R China.
中文摘要	Two principal problems of equivalency and locality in nano-scale measurement are considered in this paper. The conventional measurements of force and displacement are always closely related to the equivalency problem between the measuremental results by experimental system and the real physical status of the sample, and the locality of the mechanical quantities to be measured. There are some noticeable contradictions in nano-scale measurements induced by the two problems. In this paper, by utilizing a coupled molecular-continuum method, we illustrate the important effects of the two principal problems in atomic force microscopy (AFM) measurements on nano-scale. Our calculations and analysis of these typical mechanical measurement problems suggest that in nano-meter scale measurements, the two principal problems must be carefully dealt with. The coupled molecular-continuum method used in this paper is very effective in solving these problems on nano-scale.
学科主题	力学
类目[WOS]	Engineering, Multidisciplinary ; Mathematics, Applied ; Mechanics ; Physics, Mathematical
研究领域[WOS]	Engineering ; Mathematics ; Mechanics ; Physics
关键词[WOS]	ATOMIC-FORCE MICROSCOPE ; HAMAKER CONSTANTS ; SIMULATION ; SYSTEMS ; SURFACE ; WATER ; MICA
收录类别	SCI
语种	英语
WOS记录号	WOS:000230059700004
公开日期	2007-06-15 ; 2007-12-05 ; 2009-06-23
内容类型	期刊论文
源URL	[http://dspace.imech.ac.cn/handle/311007/17472]
专题	力学研究所_力学所知识产出(1956-2008)
推荐引用方式 GB/T 7714	Hu M,Wang HY,Bai YL,et al. Equivalency and Locality in Nano-Scale Measurement[J]. International Journal of Nonlinear Sciences and Numerical Simulation,2005,6(3):235-242.
APA	胡明,汪海英,白以龙,夏蒙棼,&柯孚久.(2005).Equivalency and Locality in Nano-Scale Measurement.International Journal of Nonlinear Sciences and Numerical Simulation,6(3),235-242.
MLA	胡明,et al."Equivalency and Locality in Nano-Scale Measurement".International Journal of Nonlinear Sciences and Numerical Simulation 6.3(2005):235-242.