Size Effects in Micro-bending Deformation of MEMS Devices Based on the Discrete Dislocation Theory

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	Size Effects in Micro-bending Deformation of MEMS Devices Based on the Discrete Dislocation Theory
	Tang S(唐山); Zhu C(朱晨); Wei YG(魏悦广)
刊名	International Journal of Nonlinear Sciences and Numerical Simulation
	2002
卷号	3 期号:3-4 页码:699-702
ISSN号	1565-1339
通讯作者	Wei, YG (reprint author), Chinese Acad Sci, Inst Mech, Lnm, Beijing 100080, Peoples R China.
中文摘要	In the present research, the discrete dislocation theory is used to analyze the size effect phenomena for the MEMS devices undergoing micro-bending load. A consistent result with the experimental one in literature is obtained. In order to check the effectiveness to use the discrete dislocation theory in predicting the size effect, both the basic version theory and the updated one are adopted simultaneously. The normalized stress-strain relations of the material are obtained for different plate thickness or for different obstacle density. The prediction results are compared with experimental results.
学科主题	力学
类目[WOS]	Engineering, Multidisciplinary ; Mathematics, Applied ; Mechanics ; Physics, Mathematical
研究领域[WOS]	Engineering ; Mathematics ; Mechanics ; Physics
关键词[WOS]	PLASTICITY
收录类别	SCI
语种	英语
WOS记录号	WOS:000176903800121
公开日期	2007-06-15 ; 2007-12-05 ; 2009-06-23
内容类型	期刊论文
源URL	[http://dspace.imech.ac.cn/handle/311007/17433]
专题	力学研究所_力学所知识产出(1956-2008)
推荐引用方式 GB/T 7714	Tang S,Zhu C,Wei YG. Size Effects in Micro-bending Deformation of MEMS Devices Based on the Discrete Dislocation Theory[J]. International Journal of Nonlinear Sciences and Numerical Simulation,2002,3(3-4):699-702.
APA	Tang S,Zhu C,&Wei YG.(2002).Size Effects in Micro-bending Deformation of MEMS Devices Based on the Discrete Dislocation Theory.International Journal of Nonlinear Sciences and Numerical Simulation,3(3-4),699-702.
MLA	Tang S,et al."Size Effects in Micro-bending Deformation of MEMS Devices Based on the Discrete Dislocation Theory".International Journal of Nonlinear Sciences and Numerical Simulation 3.3-4(2002):699-702.