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	Edge detection and accurate rectification technology in the digital detection for dry cell substratum pixel (EI收录)
	Tian, Xue Jun[1]; Xie, Quan Jun[2]; Ye, Feng[3]
会议名称	Advanced Materials Research
会议日期	May 18, 2013 - May 19, 2013
会议地点	XiShuangBanNa, China
关键词	Edge detection Eye protection Glues Gluing Image processing Industry Intelligent materials Measurements Quality assurance Quality control Technology
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/2051636
专题	华南理工大学
作者单位	1.[1] College of General Education, Zhanjiang Normal University, Zhanjiang, Guangdong, China 2.[2] Yunan Wanxing Machinery Co., Ltd, Yunfu, Guangdong, China 3.[3] South China University of Technology, Guangzhou, Guangdong, China
推荐引用方式 GB/T 7714	Tian, Xue Jun[1],Xie, Quan Jun[2],Ye, Feng[3]. Edge detection and accurate rectification technology in the digital detection for dry cell substratum pixel (EI收录)[C]. 见:Advanced Materials Research. XiShuangBanNa, China. May 18, 2013 - May 19, 2013.

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