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Preparation and characterization of free-standing BiI3 single-crystal flakes for X-ray detection application
Sun, Hui; Zhu, Xinghua; Wangyang, Peihua; Gao, Xiuying; Zhu, Shifu; Zhao, Beijun
刊名JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
2018
卷号Vol.29 No.23页码:20003-20009
ISSN号0957-4522
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/1837511
专题四川大学
作者单位1.Chengdu Univ Informat Technol, Coll Optoelect Technol, Chengdu 610225, Sichuan, Peoples R China
2.Sichuan Univ, Dept Mat Sci, Chengdu 610065, Sichuan, Peoples R China
3.Sichuan Univ Arts & Sci, Sch Intelligent Mfg, Dazhou 635000, Peoples R China
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Sun, Hui,Zhu, Xinghua,Wangyang, Peihua,et al. Preparation and characterization of free-standing BiI3 single-crystal flakes for X-ray detection application[J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,2018,Vol.29 No.23:20003-20009.
APA Sun, Hui,Zhu, Xinghua,Wangyang, Peihua,Gao, Xiuying,Zhu, Shifu,&Zhao, Beijun.(2018).Preparation and characterization of free-standing BiI3 single-crystal flakes for X-ray detection application.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,Vol.29 No.23,20003-20009.
MLA Sun, Hui,et al."Preparation and characterization of free-standing BiI3 single-crystal flakes for X-ray detection application".JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS Vol.29 No.23(2018):20003-20009.
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