Thickness dependent magnetic properties of epitaxial La0.7Sr0.3MnO3thin films prepared by chemical solution deposition method

doi:10.1016/j.ceramint.2017.05.223

	Thickness dependent magnetic properties of epitaxial La0.7Sr0.3MnO3thin films prepared by chemical solution deposition method
	Dong, Wenxia 1; Zhang, Yuanyuan 1; Qi, Ruijuan 1; Huang, Rong 1; Yang, Jing 1; Bai, Wei 1; Chen, Ying 2; Wang, Genshui 2; Dong, Xianlin 2; Tang, Xiaodong 1,3
刊名	Ceramics International
	2017
卷号	43 页码:S493-S496
ISSN号	02728842
DOI	10.1016/j.ceramint.2017.05.223
英文摘要	The correlation between films thickness and the physical properties (such as magnetic, magnetotransport properties) has been investigated in 5 nm and 160 nm La0.7Sr0.3MnO3(LSMO). The films were deposited on (100) SrTiO3(STO) substrates by chemical solution deposition method. High-resolution X-ray diffraction (HRXRD) and high-resolution transmission electron microscopy have been used to estimate the epitaxial structure and the change of strain. Both of the films are grown on STO substrates with coherent interfaces. The thinner sample has fully strained while the thicker film is partially strain relaxation. With decreasing film thickness from 160 to 5 nm, both of the TCand TMIstrongly depressed. The strain and limitation of the spin fluctuations by the film thickness are the main origins of the Tc lowering. The MR value of S1 is much larger than that of S2 at 300 K. It can be elucidated by the existence of magnetic polarons around TCand spin fluctuations in the interface between the film and the substrate. © 2017
内容类型	期刊论文
源URL	[http://ir.sic.ac.cn/handle/331005/25397]
专题	中国科学院上海硅酸盐研究所
作者单位	1.Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronic Engineering, East China Normal University, 500 Dongchuan Rd, Shanghai; 200241, China; 2.Key Laboratory of Inorganic Function Materials and Devices, Shanghai Institute of Ceramics, Chinese Academy of Sciences, 1295 Dingxi Rd, Shanghai; 200050, China; 3.Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan; Shanxi; 030006, China
推荐引用方式 GB/T 7714	Dong, Wenxia,Zhang, Yuanyuan,Qi, Ruijuan,et al. Thickness dependent magnetic properties of epitaxial La0.7Sr0.3MnO3thin films prepared by chemical solution deposition method[J]. Ceramics International,2017,43:S493-S496.
APA	Dong, Wenxia.,Zhang, Yuanyuan.,Qi, Ruijuan.,Huang, Rong.,Yang, Jing.,...&Tang, Xiaodong.(2017).Thickness dependent magnetic properties of epitaxial La0.7Sr0.3MnO3thin films prepared by chemical solution deposition method.Ceramics International,43,S493-S496.
MLA	Dong, Wenxia,et al."Thickness dependent magnetic properties of epitaxial La0.7Sr0.3MnO3thin films prepared by chemical solution deposition method".Ceramics International 43(2017):S493-S496.