Characterization of the crystallization behaviors in the PbTiO3 thin films on Si substrates by an infrared spectroscopy technique

	Characterization of the crystallization behaviors in the PbTiO3 thin films on Si substrates by an infrared spectroscopy technique
	Xiangjian Meng; Jiangong Cheng; Hongjuan Ye; Junhao Chu
刊名	Infrared Physics & Technology
	2000
卷号	41
WOS记录号	WOS:000085309700008
公开日期	2011-11-30
内容类型	期刊论文
源URL	[http://202.127.1.142/handle/181331/3579]
专题	上海技术物理研究所_上海技物所
推荐引用方式 GB/T 7714	Xiangjian Meng,Jiangong Cheng,Hongjuan Ye,et al. Characterization of the crystallization behaviors in the PbTiO3 thin films on Si substrates by an infrared spectroscopy technique[J]. Infrared Physics & Technology,2000,41.
APA	Xiangjian Meng,Jiangong Cheng,Hongjuan Ye,&Junhao Chu.(2000).Characterization of the crystallization behaviors in the PbTiO3 thin films on Si substrates by an infrared spectroscopy technique.Infrared Physics & Technology,41.
MLA	Xiangjian Meng,et al."Characterization of the crystallization behaviors in the PbTiO3 thin films on Si substrates by an infrared spectroscopy technique".Infrared Physics & Technology 41(2000).