QQ客服 官方微博 反馈留言

	Detection of Single Event Transients based on Compressed Sensing
	Cuiping Shao ;  Huiyun Li
	2017
会议地点	Australia
英文摘要	Single event transients (SETs) have seriously deteriorated the reliability Integrated circuits (ICs), especially for those in mission- or security-critical applications. Detecting and locating SETs can be useful for fault analysis and future enhancement. Traditional SET detecting methods usually require special sensors embedded into the circuits, or radiation scanning with fine resolutions over the surface for inspection. In this paper, we establish the relationship between sparsity of SETs and the overall faults. Then we develop the method of compressed sensing to detect the location of SET in ICs, without any embed sensors or imaging procession. A case study on a cryptographic IC by logic simulation is demonstrated. It verifies that the proposed method has two main advantages: 1) the SET sensitive area can be accurately identified. 2) The sampling rate is reduced by 70%, therefore the test efficiency is largely enhanced with negligible hardware overhead.
语种	英语
内容类型	会议论文
源URL	[http://ir.siat.ac.cn:8080/handle/172644/11782]
专题	深圳先进技术研究院_集成所
作者单位	2017
推荐引用方式 GB/T 7714	Cuiping Shao , Huiyun Li. Detection of Single Event Transients based on Compressed Sensing[C]. 见:. Australia.

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。