Direct Four-Probe Measurement of Grain-Boundary Resistivity and Mobility in Millimeter-Sized Graphene

	Direct Four-Probe Measurement of Grain-Boundary Resistivity and Mobility in Millimeter-Sized Graphene
	Ma, Ruisong 1,2,3; Huan, Qing 1,2; Wu, Liangmei 1,2,3; Yan, Jiahao 1,2,3; Guo, Wei 4; Zhang, Yu-Yang 1,2; Wang, Shuai 4; Bao, Lihong 1,2,3; Liu, Yunqi 5; Du, Shixuan 1,2,3
刊名	NANO LETTERS
	2017-09-01
卷号	17 期号:9 页码:5291-5296
关键词	Graphene Grain Boundary Wrinkle Four-probe Measurement Mobility
英文摘要	Grain boundaries (GBs) in polycrystalline graphene scatter charge carriers, which reduces carrier mobility and limits graphene applications in high-speed electronics. Here we report the extraction of the resistivity of GBs and the effect of GBs on carrier mobility by direct four-probe measurements on millimeter-sized graphene bicrystals grown by chemical vapor deposition (CVD). To extract the GB resistivity and carrier mobility from direct four-probe intragrain and intergrain measurements, an electronically equivalent extended 2D GB region is defined based on Ohms law. Measurements on seven representative GBs find that the maximum resistivities are in the range of several kO center dot mu m to more than 100 k Omega center dot mu m. Furthermore, the mobility in these defective regions is reduced to 0.4-5.9 parts per thousand of the mobility of single-crystal, pristine graphene. Similarly, the effect of wrinkles on carrier transport can also be derived. The present approach provides a reliable way to directly probe charge-carrier scattering at GBs and can be further applied to evaluate the GB effect of other two-dimensional polycrystalline materials, such as transition-metal dichalcogenides (TMDCs).
语种	英语
内容类型	期刊论文
源URL	[http://ir.iccas.ac.cn/handle/121111/41245]
专题	化学研究所_有机固体实验室
作者单位	1.Chinese Acad Sci, Inst Phys, POB 603, Beijing 100190, Peoples R China 2.Univ Chinese Acad Sci, Chinese Acad Sci, POB 603, Beijing 100190, Peoples R China 3.Beijing Key Lab Nanomat & Nanodevices, Beijing 100190, Peoples R China 4.Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Wuhan 430074, Hubei, Peoples R China 5.Chinese Acad Sci, Inst Chem, Key Lab Organ Solids, Beijing Natl Lab Mol Sci, Beijing 100190, Peoples R China 6.Vanderbilt Univ, Dept Phys & Astron, Nashville, TN 37235 USA 7.Vanderbilt Univ, Dept Elect Engn & Comp Sci, Nashville, TN 37235 USA
推荐引用方式 GB/T 7714	Ma, Ruisong,Huan, Qing,Wu, Liangmei,et al. Direct Four-Probe Measurement of Grain-Boundary Resistivity and Mobility in Millimeter-Sized Graphene[J]. NANO LETTERS,2017,17(9):5291-5296.
APA	Ma, Ruisong.,Huan, Qing.,Wu, Liangmei.,Yan, Jiahao.,Guo, Wei.,...&Gao, Hong-Jun.(2017).Direct Four-Probe Measurement of Grain-Boundary Resistivity and Mobility in Millimeter-Sized Graphene.NANO LETTERS,17(9),5291-5296.
MLA	Ma, Ruisong,et al."Direct Four-Probe Measurement of Grain-Boundary Resistivity and Mobility in Millimeter-Sized Graphene".NANO LETTERS 17.9(2017):5291-5296.