Bias Dependence of Radiation-Induced Narrow-Width Channel Effects in 65 nm NMOSFETs | |
Zheng, QW (Zheng, Qi-Wen); Cui, JW (Cui, Jiang-Wei); Wei, Y (Wei, Ying); Yu, XF (Yu, Xue-Feng); Lu, W (Lu, Wu); Ren, DY (Ren, Diyuan); Guo, Q (Guo, Qi) | |
刊名 | CHINESE PHYSICS LETTERS |
2018 | |
卷号 | 35期号:4页码:1-4 |
ISSN号 | 0256-307X |
DOI | 10.1088/0256-307X/35/4/046102 |
英文摘要 | The bias dependence of radiation-induced narrow-width channel effects (RINCEs) in 65-nm n-type metal-oxidesemiconductor field-effect transistors (NMOSFETs) is investigated. The threshold voltage of the narrow-width 65nm NMOSFET is negatively shifted by total ionizing dose irradiation, due to the RINCE. The experimental results show that the 65nm narrow-channel NMOSFET has a larger threshold shift when the gate terminal is kept in the ground, which is contrary to the conclusion obtained in the old generation devices. Depending on the three-dimensional simulation, we conclude that electric field distribution alteration caused by shallow trench isolation scaling is responsible for the anomalous RINCE bias dependence in 65nm technology. |
WOS记录号 | WOS:000430567000019 |
内容类型 | 期刊论文 |
源URL | [http://ir.xjipc.cas.cn/handle/365002/5269] |
专题 | 新疆理化技术研究所_中国科学院特殊环境功能材料与器件重点试验室 新疆理化技术研究所_材料物理与化学研究室 |
通讯作者 | Cui, JW (Cui, Jiang-Wei) |
作者单位 | 1.Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Key Lab Funct Mat & Devices Special Environm, Urumqi 830011, Peoples R China 2.Xinjiang Key Lab Elect Informat Mat & Device, Urumqi 830011, Peoples R China |
推荐引用方式 GB/T 7714 | Zheng, QW ,Cui, JW ,Wei, Y ,et al. Bias Dependence of Radiation-Induced Narrow-Width Channel Effects in 65 nm NMOSFETs[J]. CHINESE PHYSICS LETTERS,2018,35(4):1-4. |
APA | Zheng, QW .,Cui, JW .,Wei, Y .,Yu, XF .,Lu, W .,...&Guo, Q .(2018).Bias Dependence of Radiation-Induced Narrow-Width Channel Effects in 65 nm NMOSFETs.CHINESE PHYSICS LETTERS,35(4),1-4. |
MLA | Zheng, QW ,et al."Bias Dependence of Radiation-Induced Narrow-Width Channel Effects in 65 nm NMOSFETs".CHINESE PHYSICS LETTERS 35.4(2018):1-4. |
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