Characteristics Analysis for Nanosoldering with Atomic Force Microscope

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	Characteristics Analysis for Nanosoldering with Atomic Force Microscope
	Jiao ND(焦念东); Liu LQ(刘连庆); Xie SX(解双喜); Gao AL(高爱莲); Liu ZL(刘增磊)
刊名	Nano
	2018
卷号	13 期号:4 页码:1-8
关键词	Field-emission deposition nanosoldering nanodevice nanofabrication
ISSN号	1793-2920
通讯作者	Liu ZL(刘增磊)
产权排序	4
中文摘要	Field-emission deposition of atomic force microscope (AFM) can be used to fabricate nanopads, and therefore has potential applications in soldering nanodevices. However, the soldering effects are hard to verify because the soldering pads are of nanoscale. This paper studied the electrical, thermal and mechanical characteristics of the deposited nanopads, in order to testify the soldering effects. For this purpose, first, a carbon nanotube field effect transistor (CNTFET) was soldered to see whether the conductivity of the transistor was improved. Next, the thermal performance of the nanopads were observed by heating them in an oven. Last, the nanopads were mechanically pushed by an AFM probe to test the physical connection between the nanopads and the substrate. Experimental results showed that the nanosoldering dramatically reduced the contact resistance of the transistor. Moreover, the nanopads could withstand high temperature and mechanical push. Consequently, field-emission deposition of the AFM promised a bright future in nanosoldering.
WOS标题词	Science & Technology ; Technology ; Physical Sciences
类目[WOS]	Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied
研究领域[WOS]	Science & Technology - Other Topics ; Materials Science ; Physics
收录类别	SCI ; EI
语种	英语
WOS记录号	WOS:000431138000007
内容类型	期刊论文
源URL	[http://ir.sia.cn/handle/173321/21862]
专题	沈阳自动化研究所_数字工厂研究室
作者单位	1.School of Electronic and Electrical Engineering, Nanyang Institute of Technology, Nanyang 473004, P. R. China 2.Information Construction and Network Center, Nanyang Institute of Technology, Nanyang 473004, P. R. China 3.College of Electrical and Mechanical Engineering, Pingdingshan University, Pingdingshan 467000, P. R. China 4.Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, P. R. China
推荐引用方式 GB/T 7714	Jiao ND,Liu LQ,Xie SX,et al. Characteristics Analysis for Nanosoldering with Atomic Force Microscope[J]. Nano,2018,13(4):1-8.
APA	Jiao ND,Liu LQ,Xie SX,Gao AL,&Liu ZL.(2018).Characteristics Analysis for Nanosoldering with Atomic Force Microscope.Nano,13(4),1-8.
MLA	Jiao ND,et al."Characteristics Analysis for Nanosoldering with Atomic Force Microscope".Nano 13.4(2018):1-8.