The study of the noise immunity of chip spectrometer based on sparse recovery

doi:10.1117/12.2246783

CORC > 重庆绿色智能技术研究院 > 中国科学院重庆绿色智能技术研究院 > 集成光电技术研究中心

	The study of the noise immunity of chip spectrometer based on sparse recovery
	Sun, Feiying; Yang, Zheng; Wu, Peng; Xia, Liangping; Sun, Xiuhui; Nie, Changbin; Cui, Jun; Yin, Shaoyun; Du, Chunlei
	2016
会议日期	May 9, 2016 - May 11, 2016
会议地点	Beijing, China
DOI	10.1117/12.2246783
通讯作者	Xia, Liangping
英文摘要	The noise immunity of spectral detection is analyzed theoretically for the kind of chip spectrometer based on the combine of integrated filter matrix and sparse recovery. With the sparse representation algorithm, the mathematic model of the detection noise and condition number of filter matrix is built for the Gaussian shaped incident spectrum. In the simulations, the filter matrix with different condition number is produced by changing the cavity length with the fabry perot (FP) interference model. An exponential relationship between the spectrum recovery variance and the condition number is obtained, which is consistent with the built theory model. The result reveals that when the condition number of filter matrix is 103level, the noise tolerance of chip spectrometer will be as large as 10% when the variance is about 5 ×10-3in the sparse recovery. © 2016 SPIE.
会议录	International Symposium on High Power Lasers and High Energy Lasers and the International Symposium on Silicon-Based Photonic Integration
语种	英语
电子版国际标准刊号	1996756X
ISSN号	0277786X
内容类型	会议论文
源URL	[http://119.78.100.138/handle/2HOD01W0/4633]
专题	集成光电技术研究中心微纳制造与系统集成研究中心
作者单位	Key Laboratory of Multi-scale Manufacturing Technology, Chongqing Institute of Green and Intelligent Technology, Chinese Academy of Sciences, Chongqing; 401122, China
推荐引用方式 GB/T 7714	Sun, Feiying,Yang, Zheng,Wu, Peng,et al. The study of the noise immunity of chip spectrometer based on sparse recovery[C]. 见:. Beijing, China. May 9, 2016 - May 11, 2016.