Thickness Dependence of Dielectric, Leakage, and Ferroelectric Properties of Bi6Fe2Ti3O18 Thin Films Derived by Chemical Solution Deposition

CORC > 合肥物质科学研究院 > 中国科学院合肥物质科学研究院 > 中科院固体物理研究所

	Thickness Dependence of Dielectric, Leakage, and Ferroelectric Properties of Bi6Fe2Ti3O18 Thin Films Derived by Chemical Solution Deposition
	Dongpo Song 1,2; Xianwu Tang 1; Bin Yuan 1; Xuzhong Zuo 1; Jie Yang 1; Li Chen 1; Wenhai Song 1; Xuebin Zhu 1; Yuping Sun 1,2,3
刊名	J. Am. Ceram. Soc.
	2014
卷号	97 期号:12 页码:3857-3863
内容类型	期刊论文
源URL	[http://ir.hfcas.ac.cn/handle/334002/20985]
专题	合肥物质科学研究院_中科院固体物理研究所
作者单位	1.Key Laboratory of Materials Physics, Institute of Solid State Physics, Chinese Academy of Sciences, Hefei 230031, China 2.University of Science and Technology of China, Hefei 230026, China 3.High Magnetic Field Laboratory, Chinese Academy of Sciences, Hefei 230031, China
推荐引用方式 GB/T 7714	Dongpo Song,Xianwu Tang,Bin Yuan,et al. Thickness Dependence of Dielectric, Leakage, and Ferroelectric Properties of Bi6Fe2Ti3O18 Thin Films Derived by Chemical Solution Deposition[J]. J. Am. Ceram. Soc.,2014,97(12):3857-3863.
APA	Dongpo Song.,Xianwu Tang.,Bin Yuan.,Xuzhong Zuo.,Jie Yang.,...&Yuping Sun.(2014).Thickness Dependence of Dielectric, Leakage, and Ferroelectric Properties of Bi6Fe2Ti3O18 Thin Films Derived by Chemical Solution Deposition.J. Am. Ceram. Soc.,97(12),3857-3863.
MLA	Dongpo Song,et al."Thickness Dependence of Dielectric, Leakage, and Ferroelectric Properties of Bi6Fe2Ti3O18 Thin Films Derived by Chemical Solution Deposition".J. Am. Ceram. Soc. 97.12(2014):3857-3863.