Grayscale image recording on Ge2Sb2Te5 thin films through laser-induced structural evolution

CORC > 上海光学精密机械研究所 > 中国科学院上海光学精密机械研究所 > 中科院强激光材料重点实验室

	Grayscale image recording on Ge2Sb2Te5 thin films through laser-induced structural evolution
	Zhang, Long; Wei, Jingsong; Zhang, Kui; Zhao, Hongxia; Wei, Tao
刊名	Sci Rep
	2017
卷号	7
通讯作者	weijingsong@siom.ac.cn ; lzhang@siom.ac.cn
英文摘要	Chalcogenide Ge2Sb2Te5 thin films have been widely exploited as binary bit recording materials in optical and non-volatile electronic information storage, where the crystalline and amorphous states are marked as the information bits "0" and "1", respectively. In this work, we demonstrate the use of Ge2Sb2Te5 thin films as multi-level grayscale image recording materials. High-resolution grayscale images are recorded on Ge2Sb2Te5 thin films through taking advantage of laser-induced structural evolution characteristic. Experimental results indicate that the change of laser energy results in the structural evolution of Ge2Sb2Te5 thin films. The structural evolution induces the difference of electronic polarizability and reflectivity, and high-resolution grayscale images are recorded on Ge2Sb2Te5 thin films through direct laser writing method, accordingly.
收录类别	SCI
资助信息	National Natural Science Foundation of China [51672292, 61627826, 61137002]
WOS记录号	WOS:000393872600001
内容类型	期刊论文
源URL	[http://ir.siom.ac.cn/handle/181231/28090]
专题	上海光学精密机械研究所_中科院强激光材料重点实验室
作者单位	中国科学院上海光学精密机械研究所
推荐引用方式 GB/T 7714	Zhang, Long,Wei, Jingsong,Zhang, Kui,et al. Grayscale image recording on Ge2Sb2Te5 thin films through laser-induced structural evolution[J]. Sci Rep,2017,7.
APA	Zhang, Long,Wei, Jingsong,Zhang, Kui,Zhao, Hongxia,&Wei, Tao.(2017).Grayscale image recording on Ge2Sb2Te5 thin films through laser-induced structural evolution.Sci Rep,7.
MLA	Zhang, Long,et al."Grayscale image recording on Ge2Sb2Te5 thin films through laser-induced structural evolution".Sci Rep 7(2017).