Traceable quantum sensing and metrology relied up a quantum electrical triangle principle

CORC > 上海光学精密机械研究所 > 中国科学院上海光学精密机械研究所 > 高密度光存储技术实验室

	Traceable quantum sensing and metrology relied up a quantum electrical triangle principle
	Fang, Yan; Wang, Hengliang; Yang, Xinju; Wei, Jinsong
	2016
通讯作者	fang.yan@zs-hospital.sh.cn ; whengliang@fudan.edu.cn ; xjyang@fudan.edu.cn ; weijingsong@siom.ac.cn
英文摘要	Hybrid quantum state engineering in quantum communication and imaging(1-2) needs traceable quantum sensing and metrology, which are especially critical to quantum internet(3) and precision measurements(4) that are important across all fields of science and technology(-). We aim to set up a mode of traceable quantum sensing and metrology. We developed a method by specially transforming an atomic force microscopy (AFM) and a scanning tunneling microscopy (STM) into a conducting atomic force microscopy (C-AFM) with a feedback control loop, wherein quantum entanglement enabling higher precision was relied upon a set-point, a visible light laser beam-controlled an interferometer with a surface standard at z axis, diffractometers with lateral standards at x-y axes, four-quadrant photodiode detectors, a scanner and its image software, a phase-locked pre-amplifier, a cantilever with a kHz Pt/Au conducting tip, a double barrier tunneling junction model, a STM circuit by frequency modulation and a quantum electrical triangle principle involving single electron tunneling effect, quantum Hall effect and Josephson effect(5). The average and standard deviation result of repeated measurements on a 1 nm height local micro-region of nanomedicine crystal hybrid quantum state engineering surface and its differential pA level current and voltage (dI/dV) in time domains by using C-AFM was converted into an international system of units: Siemens (S), an indicated value 0.86x10(-12) S n=6) of a relative standard uncertainty was superior over a relative standard uncertainty reference value 2.3x10(-10) S of 2012 CODADA quantized conductance(6). It is concluded that traceable quantum sensing and metrology is emerging.
会议录	QUANTUM AND NONLINEAR OPTICS IV
语种	英语
ISSN号	0277-786X
内容类型	会议论文
源URL	[http://ir.siom.ac.cn/handle/181231/27425]
专题	上海光学精密机械研究所_高密度光存储技术实验室
作者单位	中国科学院上海光学精密机械研究所
推荐引用方式 GB/T 7714	Fang, Yan,Wang, Hengliang,Yang, Xinju,et al. Traceable quantum sensing and metrology relied up a quantum electrical triangle principle[C]. 见:.