Compact transient-grating self-referenced spectral interferometry for sub-nanojoule femtosecond pulse characterization
Li, Ruxin; Shen, Xiong; Wang, Peng; Liu, Jun
刊名Appl. Optics
2017
卷号56期号:3页码:582
通讯作者jliu@siom.ac.cn
英文摘要The self-referenced spectral interferometry (SRSI) technique, which is usually used for microjoule-level femtosecond pulse characterization, is improved to characterize weak femtosecond pulses with nanojoule based on the transient-grating effect. Both femtosecond pulses from an amplifier with 3 nJ per pulse at 1 kHz repetition rates and femtosecond pulses from an oscillator with less than 0.5 nJ per pulse at 84 MHz repetition rates are successfully characterized. Furthermore, through a special design, the optical setup of the device is even smaller than a palm, which will make it simple and convenient during the application. These improvements extend the application of the SRSI technique to the characterization of femtosecond pulses in a broad range. Not only pulses from an amplifier but also pulses from an oscillator or weak pulses used in ultrafast spectroscopy can be monitored with this SRSI method right now. (C) 2017 Optical Society of America
收录类别SCI
资助信息National Natural Science Foundation of China (NSFC) [11274327, 61521093, 61527821]; Instrument Developing Project of the Chinese Academy of Sciences (CAS) [YZ201538]; Strategic Priority Research Program of the Chinese Academy of Sciences (CAS) [XDB16]
WOS记录号WOS:000393347900060
内容类型期刊论文
源URL[http://ir.siom.ac.cn/handle/181231/27577]  
专题上海光学精密机械研究所_强场激光物理国家重点实验室
作者单位中国科学院上海光学精密机械研究所
推荐引用方式
GB/T 7714
Li, Ruxin,Shen, Xiong,Wang, Peng,et al. Compact transient-grating self-referenced spectral interferometry for sub-nanojoule femtosecond pulse characterization[J]. Appl. Optics,2017,56(3):582.
APA Li, Ruxin,Shen, Xiong,Wang, Peng,&Liu, Jun.(2017).Compact transient-grating self-referenced spectral interferometry for sub-nanojoule femtosecond pulse characterization.Appl. Optics,56(3),582.
MLA Li, Ruxin,et al."Compact transient-grating self-referenced spectral interferometry for sub-nanojoule femtosecond pulse characterization".Appl. Optics 56.3(2017):582.
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