XPS Analysis of Surface and Interface States for PTC DA/ p-Si Heterojunction

	XPS Analysis of Surface and Interface States for PTC DA/ p-Si Heterojunction
	Zhang Fujia; Zhang Jie; Zhang Dejiang; Jing Q I; Gan Runjin; Li Q I
刊名	Semiconductor Photonics and Technology
	2000
卷号	6 期号:1 页码:15
语种	英语
内容类型	期刊论文
源URL	[http://ir.lzu.edu.cn/handle/262010/178131]
专题	物理科学与技术学院_期刊论文
推荐引用方式 GB/T 7714	Zhang Fujia,Zhang Jie,Zhang Dejiang,et al. XPS Analysis of Surface and Interface States for PTC DA/ p-Si Heterojunction[J]. Semiconductor Photonics and Technology,2000,6(1):15.
APA	Zhang Fujia,Zhang Jie,Zhang Dejiang,Jing Q I,Gan Runjin,&Li Q I.(2000).XPS Analysis of Surface and Interface States for PTC DA/ p-Si Heterojunction.Semiconductor Photonics and Technology,6(1),15.
MLA	Zhang Fujia,et al."XPS Analysis of Surface and Interface States for PTC DA/ p-Si Heterojunction".Semiconductor Photonics and Technology 6.1(2000):15.