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	Measurement and evaluation on China's optimum macro tax burden
	Sun, Huiqun ; Sun HJ(孙惠军)
	2012
关键词	Consumer electronics
英文摘要	Conference Name:2012 2nd International Conference on Consumer Electronics, Communications and Networks, CECNet 2012. Conference Address: Three Gorges, China. Time:April 21, 2012 - April 23, 2012.; IEEE; The Macroscopic Tax Burden in China is a hot topic in the field of public finance. In this paper, the author try to measure China's tax burden level based on the OECD measurement scale, and then use the OLS model to estimate the optimum tax rate. Although there're still some defects, we can summarize some conclusions. 漏 2012 IEEE.
语种	英语
出处	http://dx.doi.org/10.1109/CECNet.2012.6201571
出版者	IEEE Computer Society
内容类型	其他
源URL	[http://dspace.xmu.edu.cn/handle/2288/86238]
专题	物理技术－会议论文
推荐引用方式 GB/T 7714	Sun, Huiqun,Sun HJ. Measurement and evaluation on China's optimum macro tax burden. 2012-01-01.

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