Morphological Stability of Epitaxial Thin Elastic Films by Van Der Waals Force

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	Morphological Stability of Epitaxial Thin Elastic Films by Van Der Waals Force
	Zhao YP(赵亚溥)
刊名	Archive of Applied Mechanics
	2002
卷号	72 期号:1 页码:77-84
ISSN号	0939-1533
通讯作者	Zhao, YP (reprint author), Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech, Beijing 100080, Peoples R China.
英文摘要	The morphological stability of epitaxial thin elastic films on a substrate by van der Waals force is discussed. It is found that only van der Waals force with negative Hamaker constant (A < 0) tends to stabilize the film, and the lower bound for the Hamaker constant is also obtained for the stability of thin film. The critical value of the undulation wavelength is found to be a function of both film thickness and external stress. The charateristic time-scale for surface mass diffusion scales to the fourth power to the wavelength of the perturbation.
学科主题	力学
类目[WOS]	Mechanics
研究领域[WOS]	Mechanics
收录类别	SCI ; EI
语种	英语
WOS记录号	WOS:000173782600005
公开日期	2007-06-15 ; 2007-12-05 ; 2009-06-23
内容类型	期刊论文
源URL	[http://dspace.imech.ac.cn/handle/311007/16779]
专题	力学研究所_力学所知识产出(1956-2008)
推荐引用方式 GB/T 7714	Zhao YP. Morphological Stability of Epitaxial Thin Elastic Films by Van Der Waals Force[J]. Archive of Applied Mechanics,2002,72(1):77-84.
APA	赵亚溥.(2002).Morphological Stability of Epitaxial Thin Elastic Films by Van Der Waals Force.Archive of Applied Mechanics,72(1),77-84.
MLA	赵亚溥."Morphological Stability of Epitaxial Thin Elastic Films by Van Der Waals Force".Archive of Applied Mechanics 72.1(2002):77-84.