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	通道效应在透射电镜样品厚度估测中的应用
	李月亮 ; 朱静 ; LI Yue-liang ; ZHU Jing
	2016-03-30 ; 2016-03-30
关键词	通道效应 像点强度 负球差成像 样品厚度估测 多片层法像模拟 Lithium ion battery Cathode material Li[Ni,Co,Mn]O2 Modification TN16 O652.4
其他题名	Application of channeling effect in estimating the thickness of TEM sample
中文摘要	通道效应是出射波函数的样品厚度周期效应。像差校正高分辨像中像点强度随样品厚度的变化正是这种效应的直接体现。本文提出了利用通道效应估测样品厚度的方法,通过多片层法高分辨像模拟,研究了元素种类、离焦量、像散以及带轴偏离等参量对于厚度估测的影响,并以钛酸钡陶瓷样品为实例,对厚度进行了估测。; Channeling effect is the periodic thickness effect of exit wave function,causing the column intensity in aberration-corrected HRTEM image periodically changing as the thickness of TEM sample increases. In this work,we proposed a method of estimating the thickness of TEM sample by channeling effect. Influences of parameters,such as element,defocus,astigmatism and tilt,were studied by multi-slice simulation. Thethickness of Ba Ti O3 ceramic sample was estimated as an example.
语种	中文 ; 中文
内容类型	期刊论文
源URL	[http://ir.lib.tsinghua.edu.cn/ir/item.do?handle=123456789/141785]
专题	清华大学
推荐引用方式 GB/T 7714	李月亮,朱静,LI Yue-liang,等. 通道效应在透射电镜样品厚度估测中的应用[J],2016, 2016.
APA	李月亮,朱静,LI Yue-liang,&ZHU Jing.(2016).通道效应在透射电镜样品厚度估测中的应用..
MLA	李月亮,et al."通道效应在透射电镜样品厚度估测中的应用".(2016).

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