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	NBTI-aware dual V/sub th/ assignment for leakage reduction and lifetime assurance
	Wang Yu ; Luo Hong ; He Ku ; Luo Rong ; Yang Huazhong ; Xie Yuan
	2010-10-12 ; 2010-10-12
关键词	Practical Experimental/ circuit stability integrated circuit reliability integrated circuit testing leakage currents/ leakage reduction lifetime assurance negative bias temperature instability leakage current ISCAD85 circuits NBTI-aware dual V/sub th/ assignment temporal performance degradation digital circuits PMOS threshold voltage circuit lifetime reliability factor/ B2570A Semiconductor integrated circuit design, layout, modelling and testing B0170N Reliability
中文摘要	Negative bias temperature instability (NBTI), which causes temporal performance degradation in digital circuits by affecting PMOS threshold voltage, has become the dominant circuit lifetime reliability factor. Design for lifetime reliability, especially for NBTI-induced circuit performance degradation, is emerging as one of the major design concerns. In this paper, an NBTI-aware dual V/sub th/ assignment is for the first time proposed to simultaneously reduce the circuit leakage current and ensure the circuit lifetime requirement. Our experimental results on ISCAS85 benchmark show that the NBTI-aware dual V/sub th/ assignment not only assigns more high V/sub th/ gates in the IS-CAD85 circuits and leads to up to 14.88% (average 3.46%) further leakage saving under 5% circuit performance relaxation, but also brings different optimal high V/sub th/ (on average 11 mV higher) without performance relaxation.
语种	英语
出版者	Chinese Institute of Electronics ; China
内容类型	期刊论文
源URL	[http://hdl.handle.net/123456789/82824]
专题	清华大学
推荐引用方式 GB/T 7714	Wang Yu,Luo Hong,He Ku,et al. NBTI-aware dual V/sub th/ assignment for leakage reduction and lifetime assurance[J],2010, 2010.
APA	Wang Yu,Luo Hong,He Ku,Luo Rong,Yang Huazhong,&Xie Yuan.(2010).NBTI-aware dual V/sub th/ assignment for leakage reduction and lifetime assurance..
MLA	Wang Yu,et al."NBTI-aware dual V/sub th/ assignment for leakage reduction and lifetime assurance".(2010).

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