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	纳米云纹法条纹倍增技术研究
	刘战伟 ; 谢惠民 ; 方岱宁 ; 戴福隆 ; 王卫宁 ; 方炎 ; Liu Zhanwei ; Xie Huimin ; Fang Daining ; Dai Fulong ; Wang Weining ; Fang Yan
	2010-07-19 ; 2010-07-19
关键词	纳米云纹法 倍增技术 晶格 Nano-moir� method Multiplication technique Crystal lattice TB303
其他题名	A Study on the Multiplication Technique of Nano-moir� Fringe
中文摘要	提出了一种纳米云纹法的条纹倍增技术,可用于单晶材料纳米级变形测量.在测量中,单晶材料的晶格结构由透射电镜(TEM)采集并记录在感光胶片上作为试件栅,几何光栅作为参考栅.对纳米云纹条纹的形成原理,透射电镜放大倍数与试件栅的频率关系,条纹倍增技术,位移、应变测量方法等进行了详细讨论.该方法不仅能够测量连续力学参量,如应变和位移,而且能够表征纳观非连续参量,如位错、夹杂.; A nano-moir� fringe multiplication method is proposed and used to measure nano-deformation of single crystal materials.The lattice structure of single crystal materials is captured by TEM(Transmission Electron Microscope) and acted as a specimen grating.An unidirectional grating fabricated on glass or film is selected as a reference grating.The formation principles of TEM nano-moir� fringe,the relationship between TEM magnification and grating frequency,as well as displacement and strain measurement method are discussed.A nano-moir� fringe pattern can be reproduced in a 4f optical filter system with a specimen grating and a prepared reference grating.By selecting the reference grating with specific frequency and utilizing different diffraction order,a multiplying moir� fringe pattern can be obtained.The results illustrate that this technique can be used to measure deformation in nano-scale.This method is especially useful in the measurement of inhomogeneous displacement field,and can be utilized to reveal nano-mechanical behavior such as dislocation and atomic bond failure.; 国家自然科学基金(10232030,10121202); 教育部科学技术研究重大项目(项目批准号0306); 教育部优秀青年教师资助计划; 北京市纳米光电子学重点实验室开放基金资助
语种	中文 ; 中文
内容类型	期刊论文
源URL	[http://hdl.handle.net/123456789/77090]
专题	清华大学
推荐引用方式 GB/T 7714	刘战伟,谢惠民,方岱宁,等. 纳米云纹法条纹倍增技术研究[J],2010, 2010.
APA	刘战伟.,谢惠民.,方岱宁.,戴福隆.,王卫宁.,...&Fang Yan.(2010).纳米云纹法条纹倍增技术研究..
MLA	刘战伟,et al."纳米云纹法条纹倍增技术研究".(2010).

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