| 用电子散斑法对纯镍薄片弯曲变形的测量 | |
| 郭香华 ; 方岱宁 ; 李喜德 ; GUO Xianghua ; FANG Daining ; LI Xide | |
| 2010-06-08 ; 2010-06-08 | |
| 关键词 | 应变梯度 抗弯刚度 电子散斑法 脉冲计数 stain gradient, flexural rigidity, time sequence speckle pattern interferometry, pulse counting O4-34 |
| 其他题名 | MEASUREMENT OF DEFORMATION OF PURE Ni FOILS BY SPECKLE PATTERN INTERFEROMETRY |
| 中文摘要 | 由于建立的电子散斑法有位移测量精度高、量程大的特点,且自制的力传感器灵敏度高、量程相 对较大,从而保证了本实验中镍片在三点弯中的反应被全程、精确地记录下来.基于时间序列的电子散斑法, 测出了10-100μm不同厚度的纯镍薄片在三点弯下的载荷-位移曲线,其中包括弹性部分以及进入塑性屈服 两个阶段,据此可以推出不同厚度镍片的三点弯刚度.实验表明镍片的抗弯刚度受其厚度的影响很大,尤其在 薄片厚度较小时表现得更为明显,即表现出明显的尺度效应.; By employing the sequence pulse counting method (SPCM) and a high sensitive micro load-sensor, a precise and sensitive measurement system was established to measure the load-deflection curves of pure Ni foils (purity 99.99%) under three-point micro bending. The whole deformation field and the applied force were recorded precisely and completely. On the basis of the measured curves of the pure Ni foil beams with various thickness (10 - 100μm), it is found that the elastic bending rigidity is strongly dependent upon the thickness of the micro beams, that is, an obvious size effect is demonstrated.; 国家自然科学基金项目(10025209,90208002,10232030) 教育部重点项目(0306)资助. |
| 语种 | 中文 ; 中文 |
| 内容类型 | 期刊论文 |
| 源URL | [http://hdl.handle.net/123456789/51294]  |
| 专题 | 清华大学 |
| 推荐引用方式 GB/T 7714 | 郭香华,方岱宁,李喜德,等. 用电子散斑法对纯镍薄片弯曲变形的测量[J],2010, 2010. |
| APA | 郭香华,方岱宁,李喜德,GUO Xianghua,FANG Daining,&LI Xide.(2010).用电子散斑法对纯镍薄片弯曲变形的测量.. |
| MLA | 郭香华,et al."用电子散斑法对纯镍薄片弯曲变形的测量".(2010). |
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