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	New SFA techniques for studying surface forces and thin film patterns induced by electric fields
	Zeng, Hongbo ; Tian, Yu ; Anderson, Travers H. ; Tirrell, Matthew ; Israelachvili, Jacob N.
	2010-05-10 ; 2010-05-10
关键词	MULTIPLE-BEAM INTERFEROMETRY AQUEOUS-ELECTROLYTE SOLUTIONS MICA SURFACES POLYMER-FILMS ELECTROHYDRODYNAMIC INSTABILITY APPARATUS ADHESION MICROSCOPE CONTACT LIQUIDS Chemistry, Physical
中文摘要	We describe two ways to measure normal and/or lateral forces between two surfaces in a surface forces apparatus (SFA) while an electric field is applied between the surfaces. The first method involves depositing thin conductive layers on the exposed substrate (usually mica) sheets; the second involves using the optically reflecting silver layers on the back surfaces of the sheets as the electrodes. Two types of experiments were performed using these new techniques: (1) measuring the effects of an electric field on the rheology of an similar to 40-mu m-thick film of zeolite particles suspended in silicone oil and (2) a dynamic study of electric field-induced pattern formation of a thin polymer film. In the first study, under an electric field of strength similar to 10(6) V/m the shear force or effective viscosity of the colloid suspension was found to be two orders of magnitude higher than in the absence of the field, when the expected bulk value was measured. In the dynamic study, the initially uniform film transformed into a 2-D honeycombed network of depressed cells bounded by elevated ridges that grew slowly with time in a way consistent with previously derived theories. The new techniques should be applicable to studies of other systems and interactions, such as double-layer forces, micro- and nanoelectrorheology, electric field-induced ordering of particles, and the effects of electric fields on adhesion, friction, and lubrication.
语种	英语 ; 英语
出版者	AMER CHEMICAL SOC ; WASHINGTON ; 1155 16TH ST, NW, WASHINGTON, DC 20036 USA
内容类型	期刊论文
源URL	[http://hdl.handle.net/123456789/24402]
专题	清华大学
推荐引用方式 GB/T 7714	Zeng, Hongbo,Tian, Yu,Anderson, Travers H.,et al. New SFA techniques for studying surface forces and thin film patterns induced by electric fields[J],2010, 2010.
APA	Zeng, Hongbo,Tian, Yu,Anderson, Travers H.,Tirrell, Matthew,&Israelachvili, Jacob N..(2010).New SFA techniques for studying surface forces and thin film patterns induced by electric fields..
MLA	Zeng, Hongbo,et al."New SFA techniques for studying surface forces and thin film patterns induced by electric fields".(2010).

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