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Enhancement of the orientation and adhesion of Al films on LiNbO3 with Ni underlayer
Li, DM ; Pan, F ; Niu, JB ; Liu, M
2010-05-10 ; 2010-05-10
关键词metal materials Al/Ni films electron-beam evaporation microstructure surface acoustic wave ACOUSTIC-WAVE DEVICES POWER DURABILITY ELECTRODES FILTERS GROWTH Materials Science, Multidisciplinary Metallurgy & Metallurgical Engineering
中文摘要Al/Ni films were deposited on 128 degrees Y-X LiNbO3 substrates by e-beam deposition. The influence of Ni underlayer on the microstructure, adhesion and resistivity of the Al/Ni films was investigated. It was found that Al films deposited on Ni underlayer thinner than 5 nm possessed strong texture. The textured Al/Ni films had a superior adhesion. Their resistivity decreased after annealing treatment at 200 degrees C for 30 min. With the textured Al/Ni films, a 2.30 GHz-range image-impedance connection SAW (Surface Acoustic Wave) filter was successfully fabricated.
语种英语 ; 英语
出版者NONFERROUS METALS SOCIETY CHINA ; BEIJING ; NO. 30 XUEYUAN RD, BEIJING 100083, PEOPLES R CHINA
内容类型期刊论文
源URL[http://hdl.handle.net/123456789/21325]  
专题清华大学
推荐引用方式
GB/T 7714
Li, DM,Pan, F,Niu, JB,et al. Enhancement of the orientation and adhesion of Al films on LiNbO3 with Ni underlayer[J],2010, 2010.
APA Li, DM,Pan, F,Niu, JB,&Liu, M.(2010).Enhancement of the orientation and adhesion of Al films on LiNbO3 with Ni underlayer..
MLA Li, DM,et al."Enhancement of the orientation and adhesion of Al films on LiNbO3 with Ni underlayer".(2010).
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