Blind Image Steganalysis Based on Statistical Analysis of Empirical Matrix

	Blind Image Steganalysis Based on Statistical Analysis of Empirical Matrix
	Xiaochuan Chen; Yunhong Wang; Tieniu Tan; Lei Guo
	2006
会议名称	IEEE International Conference on Pattern Recognition
会议日期	2006
会议地点	China
页码	1107-1110
会议录	Proc. IEEE International Conference on Pattern Recognition
内容类型	会议论文
源URL	[http://ir.ia.ac.cn/handle/173211/13887]
专题	自动化研究所_09年以前成果
推荐引用方式 GB/T 7714	Xiaochuan Chen,Yunhong Wang,Tieniu Tan,et al. Blind Image Steganalysis Based on Statistical Analysis of Empirical Matrix[C]. 见:IEEE International Conference on Pattern Recognition. China. 2006.