Super-resolution with a nonlinear thin film: Beam reshaping via internal multi-interference

CORC > 上海光学精密机械研究所 > 中国科学院上海光学精密机械研究所 > 高密度光存储技术实验室

	Super-resolution with a nonlinear thin film: Beam reshaping via internal multi-interference
	Wei JS(魏劲松) ; Xiao Mufei ; Zhang Feng
刊名	appl. phys. lett.
	2006
卷号	89 期号:22 页码:223126
关键词	DIFFRACTION LIMIT
ISSN号	0003-6951
中文摘要	in laser applications, the size of the focus spot can be reduced beyond the diffraction limit with a thin film of strong nonlinear optical kerr effect. we present a concise theoretical simulation of the device. the origin of the super-resolution is found to be mainly from the reshaping effect due to the strongly nonlinear refraction mediated multi-interference inside the thin film. in addition, both diffraction and self-focusing effects have been explored and found negligible for highly refractive and ultrathin films in comparison with the reshaping effect. finally, the theoretic model has been verified in experiments with single ge2sb2te5 film and sin/si/sin/ge2sb2te2 multilayer structures. (c) 2006 american institute of physics.
学科主题	光存储
收录类别	EI
语种	英语
WOS记录号	WOS:000242538500111
公开日期	2009-09-22
内容类型	期刊论文
源URL	[http://ir.siom.ac.cn/handle/181231/3823]
专题	上海光学精密机械研究所_高密度光存储技术实验室
推荐引用方式 GB/T 7714	Wei JS,Xiao Mufei,Zhang Feng. Super-resolution with a nonlinear thin film: Beam reshaping via internal multi-interference[J]. appl. phys. lett.,2006,89(22):223126.
APA	魏劲松,Xiao Mufei,&Zhang Feng.(2006).Super-resolution with a nonlinear thin film: Beam reshaping via internal multi-interference.appl. phys. lett.,89(22),223126.
MLA	魏劲松,et al."Super-resolution with a nonlinear thin film: Beam reshaping via internal multi-interference".appl. phys. lett. 89.22(2006):223126.