QQ客服 官方微博 反馈留言

	Modeling Fizeau interferometer based on ray tracing with Zemax
	He, Yiwei1,2; Hou, Xi1; Wu, Yongqian1; Wu, Fan1; Quan, Haiyang1; Liu, Fengwei1
	2015
会议名称	Proceedings of SPIE - The International Society for Optical Engineering
会议日期	2015
卷号	9677
页码	96771G
通讯作者	He, Yiwei
中文摘要	A convenient method to study the influence of error sources in Fizeau is to build a ray-tracing model to simulate the error sources. In this paper an interferometer model is presented; an extension program is called to simulate the interference; and a preliminary research of several error sources is conducted. These examples demonstrate error analysis based on interferometer models is feasible and provide some guidance for optimizing our interferometer design. © 2015 SPIE.
英文摘要	A convenient method to study the influence of error sources in Fizeau is to build a ray-tracing model to simulate the error sources. In this paper an interferometer model is presented; an extension program is called to simulate the interference; and a preliminary research of several error sources is conducted. These examples demonstrate error analysis based on interferometer models is feasible and provide some guidance for optimizing our interferometer design. © 2015 SPIE.
收录类别	SCI ; EI
学科主题	Error analysis - Errors - Interferometers - Laser optics - Optical testing - Surface measurement
语种	英语
ISSN号	0277-786X
内容类型	会议论文
源URL	[http://ir.ioe.ac.cn/handle/181551/7627]
专题	光电技术研究所_先光中心
作者单位	1.Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, Sichuan, China 2.University of Chinese Academy of Sciences, Beijing, China
推荐引用方式 GB/T 7714	He, Yiwei,Hou, Xi,Wu, Yongqian,et al. Modeling Fizeau interferometer based on ray tracing with Zemax[C]. 见:Proceedings of SPIE - The International Society for Optical Engineering. 2015.

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。