Diffraction enhanced imaging: a simple model

	Diffraction enhanced imaging: a simple model
	Zhu PP(朱佩平); Yuan QX(袁清习); Huang WX(黄万霞); Wang JY(王寯越); Shu H(舒航); Chen B(陈博); Liu YJ(刘宜晋); Li ER(李恩荣); Wu ZY(吴自玉); Zhu, PP
刊名	JOURNAL OF PHYSICS D-APPLIED PHYSICS
	2006
卷号	39 期号:19 页码:4142-4147
通讯作者	Chinese Acad Sci, Inst High Energy Phys, Beijing Synchrotron Radiat Facil, Beijing 100049, Peoples R China
英文摘要	Based on pinhole imaging and conventional x-ray projection imaging, a more general DEI (diffraction enhanced imaging) equation is derived using simple concepts in this paper. Not only can the new DEI equation explain all the same problems as with the DEI equation proposed by Chapman, but also some problems that cannot be explained with the old DEI equation, such as the noise background caused by small angle scattering diffracted by the analyser.
学科主题	Physics
类目[WOS]	Physics, Applied
研究领域[WOS]	Physics
原文出处	SCI
语种	英语
WOS记录号	WOS:000241542800005
内容类型	期刊论文
源URL	[http://ir.ihep.ac.cn/handle/311005/239963]
专题	高能物理研究所_多学科研究中心高能物理研究所_加速器中心
作者单位	中国科学院高能物理研究所
推荐引用方式 GB/T 7714	Zhu PP,Yuan QX,Huang WX,et al. Diffraction enhanced imaging: a simple model[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,2006,39(19):4142-4147.
APA	朱佩平.,袁清习.,黄万霞.,王寯越.,舒航.,...&Wu, ZY.(2006).Diffraction enhanced imaging: a simple model.JOURNAL OF PHYSICS D-APPLIED PHYSICS,39(19),4142-4147.
MLA	朱佩平,et al."Diffraction enhanced imaging: a simple model".JOURNAL OF PHYSICS D-APPLIED PHYSICS 39.19(2006):4142-4147.