The effect of film thickness on the microstructure of La0.5Ca0.5MnO3 films
Chen, XM; Wang, Y; Liu, CX; Zhao, YN; Mai, ZH; Gong, WZ; Zhao, BR; Jia, CJ; Zheng, WL; Zheng WL(郑文莉)
刊名INTERNATIONAL JOURNAL OF MODERN PHYSICS B
2002
卷号16期号:23页码:3439-3447
关键词microstructure surface interface
通讯作者Chinese Acad Sci, Inst Phys, Natl Lab Superconduct, Beijing 100080, Peoples R China ; Chinese Acad Sci, Ctr Condensed Matter Phys, Beijing 100080, Peoples R China ; Chinese Acad Sci, Inst High Energy Phys, Beijing Synchrotron Radiat Facil, Beijing 100039, Peoples R China
英文摘要La0.5Ca0.5MnO3 (LCMO) thin films grown on SrTiO3 substrate with different thickness were investigated using high resolution X-ray diffraction, small angle reflectivity, and atomic force microscope (AFM). All the films are demonstrated to be c-axis oriented. The surface and interface structure of the films were obtained. It was found that the surface morphology of the films strongly depends on the thickness, and the film will crack when the thickness of the film reach a critical thickness. The surface roughness of the films increases with the thickness. The interface between the films and the substrates are very clear. There exists a non-designed cap layer on the surface of the LCMO layer.
学科主题Physics
类目[WOS]Physics, Applied ; Physics, Condensed Matter ; Physics, Mathematical
研究领域[WOS]Physics
原文出处SCI
语种英语
WOS记录号WOS:000178300300004
内容类型期刊论文
源URL[http://ir.ihep.ac.cn/handle/311005/239916]  
专题高能物理研究所_多学科研究中心
中国科学院高能物理研究所_人力资源处
作者单位中国科学院高能物理研究所
推荐引用方式
GB/T 7714
Chen, XM,Wang, Y,Liu, CX,et al. The effect of film thickness on the microstructure of La0.5Ca0.5MnO3 films[J]. INTERNATIONAL JOURNAL OF MODERN PHYSICS B,2002,16(23):3439-3447.
APA Chen, XM.,Wang, Y.,Liu, CX.,Zhao, YN.,Mai, ZH.,...&郑文莉.(2002).The effect of film thickness on the microstructure of La0.5Ca0.5MnO3 films.INTERNATIONAL JOURNAL OF MODERN PHYSICS B,16(23),3439-3447.
MLA Chen, XM,et al."The effect of film thickness on the microstructure of La0.5Ca0.5MnO3 films".INTERNATIONAL JOURNAL OF MODERN PHYSICS B 16.23(2002):3439-3447.
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