Abnormal InGaN growth behavior in indium-desorption regime in metalorganic chemical vapor deposition
Zhou, K(周堃); Ikeda, M; Liu, JP(刘建平); Zhang, SM(张书明); Li, ZC(李增成); Feng, MX(冯美鑫); Tian, AQ(田爱琴); Wen, PY(温鹏雁); Li, DY(李德尧); Zhang, LQ(张立群)
刊名JOURNAL OF CRYSTAL GROWTH
2015
卷号409期号:0页码:51-55
关键词Growth models Metalorganic vapor phase epitaxy Nitrides Semiconducting III-V materials
通讯作者Ikeda, M (Ikeda, Masao)
英文摘要
InGaN strained bulk layers were grown by low-pressure metalorganic chemical 
 
vapor deposition on c-plane GaN/sapphire templates. Two growth regimes, mass 
 
transport limited regime and indium desorption regime, were examined for InGaN 
 
growth. In the indium desorption regime, more indium source must be fed to keep a 
 
constant indium content. In the indium desorption regime, we found an abnormally 
 
enhanced GaN growth rate, which was proved to be related to the indium desorption 
 
and dependent on the growth temperature and the indium source flow. Due to the 
 
enhanced growth rate, the optical quality of In0.16Ga0.84N layers degraded 
 
significantly.
收录类别SCI
语种英语
公开日期2015-02-03
内容类型期刊论文
源URL[http://ir.sinano.ac.cn/handle/332007/1822]  
专题苏州纳米技术与纳米仿生研究所_纳米器件及相关材料研究部_刘建平团队
推荐引用方式
GB/T 7714
Zhou, K,Ikeda, M,Liu, JP,et al. Abnormal InGaN growth behavior in indium-desorption regime in metalorganic chemical vapor deposition[J]. JOURNAL OF CRYSTAL GROWTH,2015,409(0):51-55.
APA Zhou, K.,Ikeda, M.,Liu, JP.,Zhang, SM.,Li, ZC.,...&Yang, H.(2015).Abnormal InGaN growth behavior in indium-desorption regime in metalorganic chemical vapor deposition.JOURNAL OF CRYSTAL GROWTH,409(0),51-55.
MLA Zhou, K,et al."Abnormal InGaN growth behavior in indium-desorption regime in metalorganic chemical vapor deposition".JOURNAL OF CRYSTAL GROWTH 409.0(2015):51-55.
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