Development and performance evaluation of read-out electronics system for high resolution X-ray detector
Zhang HK(张红凯); Feng ZD(冯召东); Li XH(李晓辉); Wei SJ(魏书军); Liu SQ(刘双全); Qin XB(秦秀波); Wei CF(魏存峰); Wei L(魏龙); Zhang; Hong-Kai
刊名ATOMIC ENERGY SCIENCE AND TECHNOLOGY
2015
卷号49期号:3页码:534-539
关键词Cooling temperature Dark current noise Digital signal-processing circuits Electronics system Front-end processing Readout Electronics Spatial resolution X-ray detector
其他题名高分辨率X射线探测器读出电子学系统的研制及性能测试
通讯作者张红凯
英文摘要An electronics system was developed according to the low noise requirement of FOT X-ray detector in this paper. The electronics system consists of an analog drive circuit, a front end processing circuit and a digital signal processing circuit which is based on field programmable gate array (FPGA). The performance of FOT X-ray detector was evaluated on the X-ray imaging platform. The overall system gain is 0.168 6 DN/e-, and the linear operating range of the detector is 0-154 μGy. When the cooling temperature reaches -20 , the dark current noise is 0.037 e-/(pixel·s) and the read noise is 10.9 e-. The intrinsic spatial resolution of the detector is 16 lp/mm. The results indicate that the designed read-out electronics system meets the requirements of high resolution X-ray detector. ©, 2015, Atomic Energy Press. All right reserved.
类目[WOS]713 Electronic Circuits ; 716.1 Information Theory and Signal Processing ; 721.3 Computer Circuits ; 801 Chemistry
收录类别EI
公开日期2016-05-03
内容类型期刊论文
源URL[http://ir.ihep.ac.cn/handle/311005/228946]  
专题高能物理研究所_核技术应用研究中心
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Zhang HK,Feng ZD,Li XH,et al. Development and performance evaluation of read-out electronics system for high resolution X-ray detector[J]. ATOMIC ENERGY SCIENCE AND TECHNOLOGY,2015,49(3):534-539.
APA 张红凯.,冯召东.,李晓辉.,魏书军.,刘双全.,...&Long.(2015).Development and performance evaluation of read-out electronics system for high resolution X-ray detector.ATOMIC ENERGY SCIENCE AND TECHNOLOGY,49(3),534-539.
MLA 张红凯,et al."Development and performance evaluation of read-out electronics system for high resolution X-ray detector".ATOMIC ENERGY SCIENCE AND TECHNOLOGY 49.3(2015):534-539.
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