Signal-to-noise ratio analysis of X-ray grating interferometry with the reverse projection extraction method
Wu, Z; Wang, ZL; Gao, K; Wang, DJ; Wang, SH; Chen, J; Chen, H; Zhang, K; Zhu, PP; Wu, ZY;张凯
刊名JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
2014
卷号196期号:SI页码:75-79
关键词Grating-based X-ray phase contrast imaging Photon statistics Mechanical errors Signal-to-noise ratio
英文摘要In the past decade, grating-based X-ray phase contrast imaging has attracted increasing attention. Particular efforts have been devoted to develop new information extraction method for its forthcoming practical applications. Here we discuss the noise properties of a new acquisition protocol, dubbed the "reverse projection" (RP) method, using the error propagation formula. We present a quantitative analysis of the signal-to-noise ratio of X-ray grating interferometry with this new method. As the major sources of noise, the contributions from photon statistics and mechanical errors are discussed in detail. The results show how the system parameters impact on the extracted absorption and refraction images and how they can be used to optimize the system design for foreseen practical applications, such as biomedical imaging and materials science. (C) 2014 Elsevier B.V. All rights reserved.
学科主题Spectroscopy
收录类别SCI
WOS记录号WOS:000345823400016
公开日期2016-05-03
内容类型期刊论文
源URL[http://ir.ihep.ac.cn/handle/311005/225076]  
专题高能物理研究所_多学科研究中心
推荐引用方式
GB/T 7714
Wu, Z,Wang, ZL,Gao, K,et al. Signal-to-noise ratio analysis of X-ray grating interferometry with the reverse projection extraction method[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,2014,196(SI):75-79.
APA Wu, Z.,Wang, ZL.,Gao, K.,Wang, DJ.,Wang, SH.,...&吴自玉.(2014).Signal-to-noise ratio analysis of X-ray grating interferometry with the reverse projection extraction method.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,196(SI),75-79.
MLA Wu, Z,et al."Signal-to-noise ratio analysis of X-ray grating interferometry with the reverse projection extraction method".JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 196.SI(2014):75-79.
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