Scattering imaging method in transmission x-ray microscopy

	Scattering imaging method in transmission x-ray microscopy
	Chen, J; Gao, K; Ge, X; Wang, ZL; Zhang, K; Hong, YL; Pan, ZY; Wu, Z; Zhu, PP; Yun, WB
刊名	OPTICS LETTERS
	2013
卷号	38 期号:12 页码:2068-2070
英文摘要	We present a x-ray microscopy technique based on structured illumination in a microscope that characterizes the size of the subresolution-limit features. The technique is effective for characterizing fine structures substantially beyond the Rayleigh resolution of the microscope. We carried out optical experiments to demonstrate the basic principle of this new technique. Experimental results show good agreement with theoretical predictions. This technique should find a wide range of important imaging applications with a feature size down to nanometer scale, such as oil and gas reservoir rocks, advanced composites, and functional nanodevices and materials. (C) 2013 Optical Society of America
学科主题	Optics
收录类别	SCI
WOS记录号	WOS:000320366500023
公开日期	2016-05-03
内容类型	期刊论文
源URL	[http://ir.ihep.ac.cn/handle/311005/224187]
专题	中国科学院高能物理研究所
推荐引用方式 GB/T 7714	Chen, J,Gao, K,Ge, X,et al. Scattering imaging method in transmission x-ray microscopy[J]. OPTICS LETTERS,2013,38(12):2068-2070.
APA	Chen, J.,Gao, K.,Ge, X.,Wang, ZL.,Zhang, K.,...&吴自玉.(2013).Scattering imaging method in transmission x-ray microscopy.OPTICS LETTERS,38(12),2068-2070.
MLA	Chen, J,et al."Scattering imaging method in transmission x-ray microscopy".OPTICS LETTERS 38.12(2013):2068-2070.