DIFFERENT INTERDIFFUSION CHARACTERISTICS BETWEEN AG/YBA2CU3O7-X AND AL/YBA2CU3O7-X CONTACT INTERFACES
KANG JF ; CHEN X ; WANG YX ; HAN RG ; XIONG GC ; LIAN GJ ; LI J ; WU SC
刊名solid state communications
1995
卷号94期号:2页码:99-101
关键词THIN-FILMS RESISTANCE
ISSN号0038-1098
通讯作者kang jf beijing univinst microelectrbeijing 100871peoples r china.
中文摘要the differences between the interdiffusion characteristics of ag/yba2cu3o7-x and al/yba2cu3o7-x contact interfaces have been revealed by secondary ion mass spectrometry (sims). the different electrical properties of ag/yba2cu3o7-x and yba2cu3o7-x films after high temperature treatment are well understood by the sims results.
学科主题半导体物理
收录类别SCI
语种英语
公开日期2010-11-17
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/15585]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
KANG JF,CHEN X,WANG YX,et al. DIFFERENT INTERDIFFUSION CHARACTERISTICS BETWEEN AG/YBA2CU3O7-X AND AL/YBA2CU3O7-X CONTACT INTERFACES[J]. solid state communications,1995,94(2):99-101.
APA KANG JF.,CHEN X.,WANG YX.,HAN RG.,XIONG GC.,...&WU SC.(1995).DIFFERENT INTERDIFFUSION CHARACTERISTICS BETWEEN AG/YBA2CU3O7-X AND AL/YBA2CU3O7-X CONTACT INTERFACES.solid state communications,94(2),99-101.
MLA KANG JF,et al."DIFFERENT INTERDIFFUSION CHARACTERISTICS BETWEEN AG/YBA2CU3O7-X AND AL/YBA2CU3O7-X CONTACT INTERFACES".solid state communications 94.2(1995):99-101.
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