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Browse/Search Results:  1-2 of 2 Help Selected(0)Clear Items/Page: 5101520253035404550556065707580859095100   Sort: SelectAuthor AscendingAuthor DescendingTitle AscendingTitle DescendingSubmit date AscendingSubmit date DescendingIssue Date AscendingIssue Date Descending Study on the bias-dependent effects of proton-induced damage in CdZnTe radiation detectors using ion beam induced charge microscopy 期刊论文 MICRON, 2016, 卷号: 88, 页码: 54-59 Authors:  Xi, Shouzhi;  Guo, Na;  Jie, Wanqi;  Du, Guanghua;  Shen, Hao Favorite  |  View/Download：94/0  |  Submit date：2018/05/31 Proton  Radiation damage  Ion beam induced charge microscopy  CdZnTe  Bias dependent   The CMS experiment at the CERN LHC 期刊论文 JOURNAL OF INSTRUMENTATION, 2008, 卷号: 3 Authors:  CMS Collaboration Favorite  |  View/Download：1655/0  |  Submit date：2015/12/02 RESISTIVE PLATE CHAMBERS  LEAD TUNGSTATE CRYSTALS  CATHODE STRIP CHAMBERS  ENDCAP ELECTROMAGNETIC CALORIMETER  PBWO4 SCINTILLATING CRYSTALS  MUON SOLENOID EXPERIMENT  LONG-TERM PERFORMANCE  PROTON-INDUCED DAMAGE  LEVEL GLOBAL TRIGGER  SILICON SENSORS